Automatic generation of self-test programs—a new feature of the MIMOLA design system

  • Authors:
  • Gerd Krüger

  • Affiliations:
  • -

  • Venue:
  • DAC '86 Proceedings of the 23rd ACM/IEEE Design Automation Conference
  • Year:
  • 1986

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Abstract

A method to automatically generate functional self-test programs for arbitrary processor systems including microprogrammable and custom designed special purpose types is presented. Only commonly available user information is needed, but gate-level details can be utilized as well. The generated self-test programs perform user guided tests for memory function and register decoding, functional or gate-level derived tests for combinational modules, and a machine status check to detect undesired side-effects. The programs are given in the micro- or machine code of the target system, ready for execution. First applications have shown promising results.