Vector Transfer by Self-Tested Self-Synchronization for Parallel Systems

  • Authors:
  • Fenghao Mu;Christer Svensson

  • Affiliations:
  • SwitchCore, Lund, Sweden;Linköping Univ., Linköping, Sweden

  • Venue:
  • IEEE Transactions on Parallel and Distributed Systems
  • Year:
  • 1999

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Abstract

Communications between processing elements (PEs) in very large scale parallel systems become more challenging as the function and speed of the PEs improve continuously. Clocked I/O ports may malfunction if data read failure occurs due to clock skew. There are many drawbacks in global clock distribution utilized to reduce the clock skew. This paper addresses a self-tested self-synchronization (STSS) method for vector transfer between PEs. A test signal is added to remove the data read failure. The advantages of this method are: very high data throughout, less power consumption in clock distribution, no constraints on clock skew and system scale, easy in design, less latency. A failure zone concept is used to characterize the behavior of storage elements. By using a jitter injected test signal, a robust vector transfer between PEs with arbitrary clock phases is achieved and the headache problem of the global synchronization is avoided.