Experimental Results for Self-Dual Multi-Output Combinational Circuits

Authors:
Vl. V. Saposhnikov;V. Moshanin;V. V. Saposhnikov;M. Goessel
Affiliations:
University for Railway-Engineering, Moskovski pr. 9, SU 190031 Sankt-Petersburg, Russia;Fault-Tolerant Computing Group, Institute of Informatics at the University of Potsdam, PF 601553, 14415 Potsdam, Germany. wladimir@mpag-inf.uni-potsdam.de;University for Railway-Engineering, Moskovski pr. 9, SU 190031 Sankt-Petersburg, Russia;Fault-Tolerant Computing Group, Institute of Informatics at the University of Potsdam, PF 601553, 14415 Potsdam, Germany. mgoessel@mpag-inf.uni-potsdam.de
Venue:
Journal of Electronic Testing: Theory and Applications
Year:
1999

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Abstract

In this short note, the possibilities and the limitations for the application of self-dual circuits with alternating inputs are experimentally investigated. The original circuit is assumed to be given as a netlist of gates. The necessary area overhead, the fault coverage for single stuck-at faults in test mode and the error detection probability in on-line mode due to internal stuck-at faults and stuck-at faults at the input lines are determined for MCNC benchmark circuits.