A New Design Method for Self-Checking Unidirectional Combinational Circuits

  • Authors:
  • V. V. Saposhnikov;A. Morosov;Vl. V. Saposhnikov;M. Gössel

  • Affiliations:
  • University for Railway-Engineering, Moskovski pr. 9, SU 190031 Sankt-Petersburg, Russia;University of Potsdam, Institute for Informatik, Fault-Tolerant Computing Group, Am Neuen Palais 10, PF 601553, 14415 Germany. E-mail: andre@mpag-inf.uni-potsdam.de;University for Railway-Engineering, Moskovski pr. 9, SU 190031 Sankt-Petersburg, Russia;University of Potsdam, Institute for Informatik, Fault-Tolerant Computing Group, Am Neuen Palais 10, PF 601553 14415 Germany. E-mail: mgoessel@mpag-inf.uni-potsdam.de

  • Venue:
  • Journal of Electronic Testing: Theory and Applications - Special issue on On-line testing
  • Year:
  • 1998

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Abstract

In this paper, a new method for the design of unidirectionalcombinational circuits is proposed. Carefully selectednon-unidirectional gates of the original circuit are duplicated suchthat every single gate fault can only be propagated to the circuitoutputs on paths with either an even or an odd number ofinverters. Unlike previous methods, it is not necessary to localizeall the inverters of the circuit at the primary inputs. The averagearea over head for the described method of circuit transformation is16% of the original circuit, which is less than half of the areaoverhead of other known methods. The transformed circuits aremonitored by Berger codes, or by the least significant two bits of aBerger code. All single stuck-at faults are detected by the methodproposed.