Synthesis of Circuits with Low-Cost Concurrent Error Detection Based on Bose-Lin Codes

Authors:
Debaleena Das;Nur A. Touba
Affiliations:
Computer Engineering Research Center, Department of Electrical and Computer Engineering, University of Texas, Austin, TX 78712-1084, USA. ddas@ece.utexas.edu;Computer Engineering Research Center, Department of Electrical and Computer Engineering, University of Texas, Austin, TX 78712-1084, USA. touba@ece.utexas.edu
Venue:
Journal of Electronic Testing: Theory and Applications
Year:
1999

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Abstract

The effect of test environment noise (tester noise) on testwaveforms is considered. We show that tests generated ignoring thetester noise characteristics are prone to failure when actuallyapplied to the circuit-under-test (CUT). The failure may ...