ADOLT - an adaptable online testing scheme for VLSI circuits
DATE '99 Proceedings of the conference on Design, automation and test in Europe
Synthesis of Circuits with Low-Cost Concurrent Error Detection Based on Bose-Lin Codes
Journal of Electronic Testing: Theory and Applications
14.3 Synthesis of Circuits with Low-Cost Concurrent Error Detection Based on Bose-Lin Codes
VTS '98 Proceedings of the 16th IEEE VLSI Test Symposium
Weight-Based Codes and Their Application to Concurrent Error Detection of Multilevel Circuits
VTS '99 Proceedings of the 1999 17TH IEEE VLSI Test Symposium
New Self-Checking Circuits by Use of Berger-Codes
IOLTW '00 Proceedings of the 6th IEEE International On-Line Testing Workshop (IOLTW)
Lowering power consumption in concurrent checkers via input ordering
IEEE Transactions on Very Large Scale Integration (VLSI) Systems - Nanoelectronic circuits and systems
Microprocessors & Microsystems
New Self-Checking Booth Multipliers
International Journal of Applied Mathematics and Computer Science - Selected Problems of Computer Science and Control
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Towards scalable arithmetic units with graceful degradation
ACM Transactions on Embedded Computing Systems (TECS)
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Recently, a self-testing ALU design has been proposed that uses Berger codes and compares the check value of the ALU output to a predicted check value that is calculated based on the input operand check values. Berger codes have the property of being able to detect all unidirectional errors. More efficient codes exist for detecting up to t unidirectional errors. This paper examines applying these codes to self-testing ALU designs and shows that the potential savings in check circuitry over Berger codes is up to 61%, depending on the code and the information word length.