14.3 Synthesis of Circuits with Low-Cost Concurrent Error Detection Based on Bose-Lin Codes

Authors:
D. Das;N. A. Touba
Affiliations:
-;-
Venue:
VTS '98 Proceedings of the 16th IEEE VLSI Test Symposium
Year:
1998

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Abstract

This paper presents a procedure for synthesizing multilevel circuits with concurrent error detection based on Bose-Lin codes. Bose-Lin codes are an efficient solution for providing concurrent error detection as they are separable codes and have a fixed number of check bits, independent of the number of information bits. Furthermore, Bose-Lin code checkers have a simple structure as they are based on modulo operations. Procedures are described for synthesizing circuits in a way that their structure ensures that all single-point faults can only cause errors that are detected by a Bose-Lin code. This paper also presents an efficient scheme for concurrent error detection in sequential circuits. Both the state bits and the output bits are encoded with a Bose-Lin code and their checking is combined such that one checker suffices. Results indicate low area overhead. The cost of concurrent error detection is reduced significantly compared to other methods.