The future of IC design, testing, and manufacturing
IEEE Design & Test
CAD for nanometer silicon design challenges and success
IEEE Transactions on Very Large Scale Integration (VLSI) Systems - Nanoelectronic circuits and systems
Backend CAD flows for "restrictive design rules"
Proceedings of the 2004 IEEE/ACM International conference on Computer-aided design
Is your layout density verification exact?: a fast exact algorithm for density calculation
Proceedings of the 2007 international symposium on Physical design
Concurrent wire spreading, widening, and filling
Proceedings of the 44th annual Design Automation Conference
Proceedings of the 2008 IEEE/ACM International Conference on Computer-Aided Design
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