Scanning datapaths: a fast and effective partial scan selection technique

Authors:
M. L. Flottes;R. Pires;B. Rouzeyre;L. Volpe
Affiliations:
Laboratoire d'Informatique, de Robotique et de Micro-électronique de Montpellier, U.M. CNRS 9928, 161 rue Ada, 34392 Montpellier Cedex 5, France;Laboratoire d'Informatique, de Robotique et de Micro-électronique de Montpellier, U.M. CNRS 9928, 161 rue Ada, 34392 Montpellier Cedex 5, France;Laboratoire d'Informatique, de Robotique et de Micro-électronique de Montpellier, U.M. CNRS 9928, 161 rue Ada, 34392 Montpellier Cedex 5, France;Laboratoire d'Informatique, de Robotique et de Micro-électronique de Montpellier, U.M. CNRS 9928, 161 rue Ada, 34392 Montpellier Cedex 5, France
Venue:
Proceedings of the conference on Design, automation and test in Europe
Year:
1998

Citing 3
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Abstract

In this paper, we present a method for quickly identifying the scan path chain of datapaths. The originality of the method resides in working with both RT and gate-level level descriptions of circuits. The proposed technique results in a very significant reduction on the CPU time required for scan path selection. We investigate also some directions for the incorporation of partial scan methodology within High Level Synthesis for Testability.