The selfish gene algorithm: a new evolutionary optimization strategy
SAC '98 Proceedings of the 1998 ACM symposium on Applied Computing
Circular Self-Test Path for FSMs
IEEE Design & Test
Synthesizing for Scan Dependence in Built-In Self-Testable Designs
Proceedings of the IEEE International Test Conference on Designing, Testing, and Diagnostics - Join Them
Obtaining High Fault Coverage with Circular BIST Via State Skipping
VTS '97 Proceedings of the 15th IEEE VLSI Test Symposium
Low Power BIST via Non-Linear Hybrid Cellular Automata
VTS '00 Proceedings of the 18th IEEE VLSI Test Symposium
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