An implication-based method to detect multi-cycle paths in large sequential circuits

  • Authors:
  • Hiroyuki Higuchi

  • Affiliations:
  • Fujitsu Laboratories Ltd, Kamikodanaka, Nakahara-Ku, Japan

  • Venue:
  • Proceedings of the 39th annual Design Automation Conference
  • Year:
  • 2002

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Abstract

This paper proposes a fast multi-cycle path analysis method for large sequential circuits. It determines whether or not all the paths between every flip-flop pair are multi-cycle paths. The proposed method is based on ATPG techniques, especially on implication techniques, to utilize circuit structure and multi-cycle path condition directly. The method also checks whether or not the multi-cycle path may be invalidated by static hazards in combinational logic parts. Experimental results show that our method is much faster than conventional ones.