Efficient linear circuit analysis by Pade´ approximation via the Lanczos process
EURO-DAC '94 Proceedings of the conference on European design automation
Addressing high frequency effects in VLSI interconnects with full wave model and CFH
ICCAD '95 Proceedings of the 1995 IEEE/ACM international conference on Computer-aided design
Proceedings of the 1996 IEEE/ACM international conference on Computer-aided design
ICCAD '97 Proceedings of the 1997 IEEE/ACM international conference on Computer-aided design
Reduced-order modelling of linear time-varying systems
Proceedings of the 1998 IEEE/ACM international conference on Computer-aided design
PASTEL: a parameterized memory characterization system
Proceedings of the conference on Design, automation and test in Europe
Substrate crosstalk analysis in mixed signal CMOS integrated circuits: embedded tutorial
ASP-DAC '00 Proceedings of the 2000 Asia and South Pacific Design Automation Conference
Reduced Order Modeling for RLC Interconnect Tree Using Hurwitz Polynomial
Analog Integrated Circuits and Signal Processing
Microelectronic Engineering
Krylov subspace techniques for reduced-order modeling of large-scale dynamical systems
Applied Numerical Mathematics
Interconnect Geometry Optimization Using Modular Artificial Neural Networks
Analog Integrated Circuits and Signal Processing
Signal Delay in Coupled, Distributed RC Lines in the Presence of Temporal Proximity
ARVLSI '97 Proceedings of the 17th Conference on Advanced Research in VLSI (ARVLSI '97)
Wire Length and Width Bound Generation for High-Speed MCM and PCB Designs
MCMC '97 Proceedings of the 1997 Conference on IEEE Multi-Chip Module Conference
Design and verification of high-speed VLSI physical design
Journal of Computer Science and Technology
Numerical Simulation and Modelling of Electronic and Biochemical Systems
Foundations and Trends in Electronic Design Automation
Manifold construction and parameterization for nonlinear manifold-based model reduction
Proceedings of the 2010 Asia and South Pacific Design Automation Conference
Journal of Electronic Testing: Theory and Applications
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