PASTEL: a parameterized memory characterization system

  • Authors:
  • K. Ogawa;M. Kohno;F. Kitamura

  • Affiliations:
  • Design Automation Department, System LSI Division, Semiconductor Company, Sony;Design Automation Department, System LSI Division, Semiconductor Company, Sony;Design Automation Department, System LSI Division, Semiconductor Company, Sony

  • Venue:
  • Proceedings of the conference on Design, automation and test in Europe
  • Year:
  • 1998

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Abstract

PASTEL is a parameterized memory characterization system which extracts the characteristics of ASIC on-chip-memories such as delay, timing and power consumption which are important in LSI logic design. PASTEL is a fully-automated process from exact wire-RC extraction through circuit reduction, input vector generation, waveform measurement, data-sheet and library creation. The circuit reduction scheme can reduce the circuit simulation time by 2 order of magnitude while maintaining delay error within 100pSec of exact simulation.