Automatic characterization and modeling of power consumption in static RAMs

  • Authors:
  • Mauro Chinosi;Roberto Zafalon;Carlo Guardiani

  • Affiliations:
  • STMicroelectronics CR&D I-20041, Agrate B. (MI), Italy;STMicroelectronics CR&D I-20041, Agrate B. (MI), Italy;STMicroelectronics CR&D I-20041, Agrate B. (MI), Italy

  • Venue:
  • ISLPED '98 Proceedings of the 1998 international symposium on Low power electronics and design
  • Year:
  • 1998

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Abstract

An automatic modeling technique is presented in this paper that allows to build an accurate model of power consumption in embedded memory blocks. A software neural-network is used to create a regression tree by automatically splitting those variables that have a discontinuous effect on the power consumption. An application of the methodology to the modeling of a 0.35µm CMOS embedded SRAM is presented.