A practical current sensing technique for IDDQ testing
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Probability to Achieve TSC Goal
IEEE Transactions on Computers
Fault-tolerant computer system design
Fault-tolerant computer system design
On-Line Testing for VLSI—A Compendium of Approaches
Journal of Electronic Testing: Theory and Applications - Special issue on On-line testing
IDDQ Testing: Issues Present and Future
IEEE Design & Test
A strongly code disjoint built-in current sensor for strongly fault-secure static CMOS realizations
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Analysis of a BICS-Only Concurrent Error Detection Method
IEEE Transactions on Computers
Studies of the SEMATECH IDDq test data
Journal of Systems Architecture: the EUROMICRO Journal - Defect and fault tolerance in VLSI Systems
An error recoverable structure based on complementary logic and alternating-retry
Journal of Computer Science and Technology
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As we approaching the deep-submicron era, the ever-increasing level of integration has begun to bring much attention to the product reliability. Besides the traditional critical, highly reliable and high safety missions, online VLSI testing will soon be needed in other fault-tolerant applications such as highly available, high maintainability and highly failure resilient missions. New on-ine testing methods must be used to provide cost efficiency in these not-so-critical applications. Analogous to the offline testing, we may examine either the voltage output or the current usage during online testing to determine the vitality of the circuit. Online current testing can be used with the traditional online (function) testing methods or can be used independently. Since there is a wide spectrum of fault tolerant missions and goals, the use of online current testing plus traditional methods will help fill the gaps.When using only the current monitoring online, we have an option to reuse the existing on-chip current sensors for online testing. These sensors are an integral part of the circuit and have been placed to aid in production tests. Consequently, such a method needs no extra hardware and no extra designing effort. In other words, an IC chip equipped with built-in current sensors already has online testing potential.