Almost sure fault tolerance in random graphs
SIAM Journal on Computing
Built-In Testing of Integrated Circuit Wafers
IEEE Transactions on Computers
Fault tolerant arrays
The Design and Analysis of Computer Algorithms
The Design and Analysis of Computer Algorithms
Fault detection and diagnosis in multiprocessor systems
Fault detection and diagnosis in multiprocessor systems
Computational Aspects of VLSI
A Diagnosis Algorithm for Constant Degree Structures and Its Application to VLSI Circuit Testing
IEEE Transactions on Parallel and Distributed Systems
Optimal Diagnosis of Heterogeneous Systems with Random Faults
IEEE Transactions on Computers
Boundary Scan-Based Relay Wave Propagation Test of Arrays of Identical Structures
IEEE Transactions on Computers
Correct and Almost Complete Diagnosis of Processor Grids
IEEE Transactions on Computers
Evaluation of a Diagnosis Algorithm for Regular Structures
IEEE Transactions on Computers
Fault-diagnosis of grid structures
Theoretical Computer Science - Dependable computing
Diagnostic Model and Diagnosis Algorithm of a SIMD Computer
EDCC-3 Proceedings of the Third European Dependable Computing Conference on Dependable Computing
What Designers of Bus and Network Architectures Should Know about Hypercubes
IEEE Transactions on Computers
Hierarchical Probablistic Diagnosis of MCMs on Large-Area Substrates
VLSID '96 Proceedings of the 9th International Conference on VLSI Design: VLSI in Mobile Communication
Worst-Case Diagnosis Completeness in Regular Graphs under the PMC Model
IEEE Transactions on Computers
Journal of Electronic Testing: Theory and Applications
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We demonstrate a structure for mutual test among N processing elements. We indicate how this structure might be used to identify the good dice on a semiconductor wafer at a cost below that of current techniques. Under either a digraph or a comparison model, our proposed test structure has the following properties: 1) It is nearly regular. 2) It can be laid out in area O(/spl ominus/(n). 3) In time /spl ominus/(N) and with high probability, all but at most an arbitrarily small fraction of the good elements can be identified. 4) The number of tests or comparisons per element is bounded by a constant. We approximate this constant analytically. The result is a substantial savings over the /spl ominus/(log N) tests per element in regular structures whose purpose is to identify, with high probability, every good element. In contrast with the majority of previous work, our results apply even when less than half of the elements are good.