PSBIST: A Partial-Scan Based Built-In Self-Test Scheme
Proceedings of the IEEE International Test Conference on Designing, Testing, and Diagnostics - Join Them
Design for testability method for CML digital circuits
DATE '99 Proceedings of the conference on Design, automation and test in Europe
Journal of Electronic Testing: Theory and Applications
A Unified DFT Approach for BIST and External Test
Journal of Electronic Testing: Theory and Applications
8.2 On Synchronizing Sequences and Test Sequence Partitioning
VTS '98 Proceedings of the 16th IEEE VLSI Test Symposium
Hi-index | 14.98 |
In this paper, the initialization of sequential circuits using pseudorandom input patterns is addressed. An extended Markov chain model that covers the initialization phase is proposed. This model support the theoretical framework used to demonstrate that sequential circuits can be initialized with pseudorandom vectors. This leads to a uniform BIST approach in which initialization and testing are performed together with a single pseudorandom generator.