Fault Coverage and Test Length Estimation for Random Pattern Testing
IEEE Transactions on Computers - Special issue on fault-tolerant computing
On the Use of Counters for Reproducing Deterministic Test Sets
IEEE Transactions on Computers
Distributed Generation of Weighted Random Patterns
IEEE Transactions on Computers
Deterministic Test Pattern Reproduction by a Counter
EDTC '96 Proceedings of the 1996 European conference on Design and Test
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