Generation and application of pseudorandom sequences for random testing

Improving Quality With a Manufacturing Process

IEEE Software

A Markov chain sequence generator for power macromodeling

Proceedings of the 2002 IEEE/ACM international conference on Computer-aided design

Error masking in compact testing based on the Hamming code and its modifications

ATS '95 Proceedings of the 4th Asian Test Symposium

Pseudo-exhaustive word-oriented DRAM testing

EDTC '95 Proceedings of the 1995 European conference on Design and Test

BIST for Embedded Word-Oriented DRAM

MTDT '98 Proceedings of the 1998 IEEE International Workshop on Memory Technology, Design and Testing

Planar High Performance Ring Generators

VTS '04 Proceedings of the 22nd IEEE VLSI Test Symposium

A Signature Analysis Technique for the Identification of Failing Vectors with Application to Scan-BIST*

Journal of Electronic Testing: Theory and Applications

A self-checking signature scheme for checking backdoor security attacks in internet

Journal of High Speed Networks

High Performance Dense Ring Generators

IEEE Transactions on Computers

"No-CPU" chaotic robots: from classroom to commerce

IEEE Circuits and Systems Magazine