PODEM-X: An automatic test generation system for VLSI logic structures

  • Authors:
  • P. Goel;B. C. Rosales

  • Affiliations:
  • International Business Machines Corporation, B22/951, P.O. Box 390, Poughkeepsie, N.Y.;IBM World Trade Corporation, Boeblingen, Germany

  • Venue:
  • 25 years of DAC Papers on Twenty-five years of electronic design automation
  • Year:
  • 1988

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Abstract