IS-FPGA: a new symmetric FPGA architecture with implicit scan

Evaluation of delay fault testability of LUTs for the enhancement of application-dependent testing of FPGAs

Journal of Systems Architecture: the EUROMICRO Journal - Special issue: Reconfigurable systems

A Multi-Configuration Strategy for an Application Dependent Testing of FPGAs

VTS '04 Proceedings of the 22nd IEEE VLSI Test Symposium

Application-Specific Bridging Fault Testing of FPGAs

Journal of Electronic Testing: Theory and Applications

A New FPGA for DSP Applications Integrating BIST Capabilities

Journal of Electronic Testing: Theory and Applications

Delay Fault Testing of Look-Up Tables in SRAM-Based FPGAs

Journal of Electronic Testing: Theory and Applications

Application-dependent testing of FPGAs

IEEE Transactions on Very Large Scale Integration (VLSI) Systems

System-on-Chip Test Architectures: Nanometer Design for Testability

System-on-Chip Test Architectures: Nanometer Design for Testability

Sigmoid function approximation for ANN implementation in FPGA devices

CSECS '10 Proceedings of the 9th WSEAS international conference on Circuits, systems, electronics, control & signal processing

Memory block based scan-BIST architecture for application-dependent FPGA testing

Proceedings of the 2014 ACM/SIGDA international symposium on Field-programmable gate arrays