An Effective BIST Scheme for Booth Multipliers

An Effective Multi-Chip BIST Scheme

Journal of Electronic Testing: Theory and Applications - Special issue on multi-chip testing and design for testability

Scalable Test Generators for High-Speed Datapath Circuits

Journal of Electronic Testing: Theory and Applications - Special issue on On-line testing

Test Generation and Fault Simulation for Cell Fault Model using Stuck-at Fault Model based Test Tools

Journal of Electronic Testing: Theory and Applications

BISTing Datapaths under Heterogeneous Test Schemes

Journal of Electronic Testing: Theory and Applications - Special issue on the IEEE European Test Workshop

An Effective BIST Scheme for Arithmetic Logic Un i t s

ITC '97 Proceedings of the 1997 IEEE International Test Conference

Accumulator-based pseudo-exhaustive two-pattern generation

Journal of Systems Architecture: the EUROMICRO Journal

Recursive pseudo-exhaustive two-pattern generation

IEEE Transactions on Very Large Scale Integration (VLSI) Systems