Test generation for Gigahertz processors using an automatic functional constraint extractor
Proceedings of the 36th annual ACM/IEEE Design Automation Conference
Synthesis for Testability by Two-Clock Control
VLSID '97 Proceedings of the Tenth International Conference on VLSI Design: VLSI in Multimedia Applications
Efficient Hierarchical Approach to Test Generation for Digital Systems
ISQED '00 Proceedings of the 1st International Symposium on Quality of Electronic Design
Behavioral test generation using mixed integer non-linear programming
ITC'94 Proceedings of the 1994 international conference on Test
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