Behavioral test generation using mixed integer non-linear programming

Authors:
R. S. Ramchandani;D. E. Thomas
Affiliations:
SRC-CMU Center for Computer-Aided Design, Dept. of Electrical and Computer Engineering, Carnegie Mellon University, Pittsburgh, PA;SRC-CMU Center for Computer-Aided Design, Dept. of Electrical and Computer Engineering, Carnegie Mellon University, Pittsburgh, PA
Venue:
ITC'94 Proceedings of the 1994 international conference on Test
Year:
1994

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Abstract

This paper describes a novel technique to generate test vectors for single stuck-at faults using the behavioral description of the circuit function and the mapping from the behavior into the hardware that implements it. The test vector generation problem is formulated as a Mixed Integer Non-Linear Programming (MINLP) problem, and the test vectors are obtained by solving a series of MINLPs. The technique has been implemented and results from this approach show an order of magnitude speed up in test generation compared to existing gate-level sequential test generation tools.