Differential fault simulation - a fast method using minimal memory
DAC '89 Proceedings of the 26th ACM/IEEE Design Automation Conference
The Ballast Methodology for Structured Partial Scan Design
IEEE Transactions on Computers
A Partial Scan Method for Sequential Circuits with Feedback
IEEE Transactions on Computers
Simulation of embedded memories by defective hashing
IBM Journal of Research and Development
On removing redundancy in sequential circuits
DAC '91 Proceedings of the 28th ACM/IEEE Design Automation Conference
Initializability Consideration in Sequential Machine Synthesis
IEEE Transactions on Computers
A laboratory for building computers
SIGCSE '92 Proceedings of the twenty-third SIGCSE technical symposium on Computer science education
An Effective BIST Scheme for ROM's
IEEE Transactions on Computers - Special issue on fault-tolerant computing
Automated multi-cycle symbolic timing verification of microprocessor-based designs
DAC '94 Proceedings of the 31st annual Design Automation Conference
Gate-level test generation for sequential circuits
ACM Transactions on Design Automation of Electronic Systems (TODAES)
Improving digital circuit simulation: a knowledge based approach
WSC '88 Proceedings of the 20th conference on Winter simulation
Partial Scan Testing on the Register-Transfer Level
Journal of Electronic Testing: Theory and Applications
An Expert System to Automate Timing Design
IEEE Design & Test
Designing and Implementing an Architecture with Boundary Scan
IEEE Design & Test
Designing in Power-Down Test Circuits
IEEE Design & Test
IEEE Design & Test
Testability Implications of Performance-Driven Logic Synthesis
IEEE Design & Test
Training diploma students on ATE-related module
ATS '95 Proceedings of the 4th Asian Test Symposium
EDTC '95 Proceedings of the 1995 European conference on Design and Test
Test generation for cyclic combinational circuits
VLSID '95 Proceedings of the 8th International Conference on VLSI Design
Sequential Circuit Testing: From DFT to SFT
VLSID '97 Proceedings of the Tenth International Conference on VLSI Design: VLSI in Multimedia Applications
Combinational Test Generation for Various Classes of Acyclic Sequential Circuits
ITC '01 Proceedings of the 2001 IEEE International Test Conference
Random Pattern Fault Simulation in Multi-Valued Circuits
ISMVL '95 Proceedings of the 25th International Symposium on Multiple-Valued Logic
Triggering Creativity in Science and Engineering: Reflection as a Catalyst
Journal of Intelligent and Robotic Systems
Specification of Conditions for Error Diagnostics
Electronic Notes in Theoretical Computer Science (ENTCS)
GECCO '96 Proceedings of the 1st annual conference on Genetic and evolutionary computation
A modeling and simulation methodology for analyzing ATM network vulnerabilities
Computer Communications
Prediction of area and length complexity measures for binary decision diagrams
Expert Systems with Applications: An International Journal
Behavioral test generation using mixed integer non-linear programming
ITC'94 Proceedings of the 1994 international conference on Test
Practical production testing of ISDN circuit boards
ITC'88 Proceedings of the 1988 international conference on Test: new frontiers in testing
What is the path to fast fault simulation?
ITC'88 Proceedings of the 1988 international conference on Test: new frontiers in testing
Digital testing theory and practice
ITC'88 Proceedings of the 1988 international conference on Test: new frontiers in testing
On behavior fault modeling for combinational digital designs
ITC'88 Proceedings of the 1988 international conference on Test: new frontiers in testing
Evaluation of a fan out stem based fault simulation in sequential circuits
Mathematical and Computer Modelling: An International Journal
Formal Verification and Diagnosis of Combinational Circuit Designs with Propositional Logic
Fundamenta Informaticae
Overcoming post-silicon validation challenges through quick error detection (QED)
Proceedings of the Conference on Design, Automation and Test in Europe
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