Logic testing and design for testability
Logic testing and design for testability
Digital logic testing and simulation
Digital logic testing and simulation
Introduction to VLSI testing
An Implicit Enumeration Algorithm to Generate Tests for Combinational Logic Circuits
IEEE Transactions on Computers
A Deductive Method for Simulating Faults in Logic Circuits
IEEE Transactions on Computers
Diagnosis of automata failures: a calculus and a method
IBM Journal of Research and Development
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This paper presents the approach adopted by a tertiary institution in teaching ATE-related module to final year students. The Automated Test Systems module is one of the three core subjects taught in the Microelectronics option of a Diploma offered by the Electronics and Communication Engineering (EC) Department of the Singapore Polytechnic. The module aims, teaching methods and means of assessment were developed based on the Singapore Polytechnic Education Model [1]. Due to the rapid development of technology used in automated test equipment, there was a need to develop further material for continuing education. A brief description of a module taken in the Advanced Diploma in Microelectronics, illustrates the various aspects of generating test patterns for printed circuit boards. The importance placed on practical training can be seen from the two industry-standard automatic test systems used in the laboratory session.