Automatic test knowledge extraction from VHDL (ATKET)

High-level synthesis for testability: a survey and perspective

DAC '96 Proceedings of the 33rd annual Design Automation Conference

BDD-based testability estimation of VHDL designs

EURO-DAC '96/EURO-VHDL '96 Proceedings of the conference on European design automation

Design for Testability Techniques at the Behavioraland Register-Transfer Levels

Journal of Electronic Testing: Theory and Applications - special issue on high-level test synthesis

RTL Test Justification and Propagation Analysis for Modular Designs

Journal of Electronic Testing: Theory and Applications - special issue on high-level test synthesis

Test generation for Gigahertz processors using an automatic functional constraint extractor

Proceedings of the 36th annual ACM/IEEE Design Automation Conference

Fast Hierarchical Test Path Construction for Circuits with DFT-Free Controller-Datapath Interface

Journal of Electronic Testing: Theory and Applications

A Hierarchical Test Generation Approach Using Program Slicing Techniques on Hardware Description Languages

Journal of Electronic Testing: Theory and Applications

Test session oriented built-in self-testable data path synthesis

ITC '98 Proceedings of the 1998 IEEE International Test Conference

DFT guidance through RTL test justification and propagation analysis

ITC '98 Proceedings of the 1998 IEEE International Test Conference

A scalable software-based self-test methodology for programmable processors

Proceedings of the 40th annual Design Automation Conference

How to Avoid Random Walks in Hierarchical Test Path Identification

ETW '00 Proceedings of the IEEE European Test Workshop

Software-based self-test methodology for crosstalk faults in processors

HLDVT '03 Proceedings of the Eighth IEEE International Workshop on High-Level Design Validation and Test Workshop

Constraint extraction for pseudo-functional scan-based delay testing

Proceedings of the 2005 Asia and South Pacific Design Automation Conference

A Methodology for Handling Complex Functional Constraints for Large Industrial Designs

Journal of Electronic Testing: Theory and Applications

A hierarchical environment for interactive test engineering

ITC'94 Proceedings of the 1994 international conference on Test

Behavioral test generation using mixed integer non-linear programming

ITC'94 Proceedings of the 1994 international conference on Test

Challenges in fault detection

FTCS'95 Proceedings of the Twenty-Fifth international conference on Fault-tolerant computing