On-Line Testing for VLSI—A Compendium of Approaches
Journal of Electronic Testing: Theory and Applications - Special issue on On-line testing
A CAD framework for generating self-checking multipliers based on residue codes
DATE '99 Proceedings of the conference on Design, automation and test in Europe
Online BIST for Embedded Systems
IEEE Design & Test
On-Chip IDDQ Testing in the AE11 Fail-Stop Controller
IEEE Design & Test
A Fault Tolerant Approach to Microprocessor Design
DSN '01 Proceedings of the 2001 International Conference on Dependable Systems and Networks (formerly: FTCS)
Fault-tolerant platforms for automotive safety-critical applications
Proceedings of the 2003 international conference on Compilers, architecture and synthesis for embedded systems
Deployment of Better Than Worst-Case Design: Solutions and Needs
ICCD '05 Proceedings of the 2005 International Conference on Computer Design
Architecting a reliable CMP switch architecture
ACM Transactions on Architecture and Code Optimization (TACO)
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