Stuck-Fault Tests vs. Actual Defects
ITC '00 Proceedings of the 2000 IEEE International Test Conference
BUSpec: A framework for generation of verification aids for standard bus protocol specifications
Integration, the VLSI Journal
System-on-Chip Test Architectures: Nanometer Design for Testability
System-on-Chip Test Architectures: Nanometer Design for Testability
Statistical defect-detection analysis of test sets using readily-available tester data
Proceedings of the International Conference on Computer-Aided Design
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