A unified approach to the extraction of realistic multiple bridging and break faults
EURO-DAC '95/EURO-VHDL '95 Proceedings of the conference on European design automation
Defect-Oriented Sampling of Non-Equally Probable Faults in VLSI Systems
Journal of Electronic Testing: Theory and Applications
Synthesis of I/sub DDQ/-testable circuits: integrating built-in current sensors
EDTC '95 Proceedings of the 1995 European conference on Design and Test
13.2 Sampling Techniques of Non-Equally Probable Faults in VLSI Systems
VTS '98 Proceedings of the 16th IEEE VLSI Test Symposium
Simulating Realistic Bridging and Crosstalk Faults in an Industrial Setting
Journal of Electronic Testing: Theory and Applications
| Hi-index | 0.00 |