Fault simulation programs for integrated-circuit yield estimations
IBM Journal of Research and Development
A net-oriented method for realistic fault analysis
ICCAD '93 Proceedings of the 1993 IEEE/ACM international conference on Computer-aided design
Simulation Results of an Efficient Defect-Analysis Procedure
Proceedings of the IEEE International Test Conference on TEST: The Next 25 Years
SOME FUTURE DIRECTIONS IN FAULT MODELING AND TEST PATTERN GENERATION RESEARCH
SOME FUTURE DIRECTIONS IN FAULT MODELING AND TEST PATTERN GENERATION RESEARCH
Yield model for fault clusters within integrated circuits
IBM Journal of Research and Development
Computational Aspects of VLSI
Simulating Realistic Bridging and Crosstalk Faults in an Industrial Setting
Journal of Electronic Testing: Theory and Applications
Hi-index | 0.00 |