Space and time compaction schemes for embedded cores

Efficient Construction of Aliasing-Free Compaction Circuitry

IEEE Micro

Channel Width Test Data Compression under a Limited Number of Test Inputs and Outputs

VLSID '03 Proceedings of the 16th International Conference on VLSI Design

Compacting Test Responses for Deeply Embedded SoC Cores

IEEE Design & Test

Cost-Driven Selection of Parity Trees

VTS '04 Proceedings of the 22nd IEEE VLSI Test Symposium

Non-Intrusive Concurrent Error Detection in FSMs through State/Output Compaction and Monitoring via Parity Trees

DATE '03 Proceedings of the conference on Design, Automation and Test in Europe - Volume 1