Generating Test Cases for a Timed I/O Automaton Model

  • Authors:
  • Teruo Higashino;Akio Nakata;Kenichi Taniguchi;Ana R. Cavalli

  • Affiliations:
  • -;-;-;-

  • Venue:
  • Proceedings of the IFIP TC6 12th International Workshop on Testing Communicating Systems: Method and Applications
  • Year:
  • 1999

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Abstract