Process variation tolerant SRAM array for ultra low voltage applications
Proceedings of the 45th annual Design Automation Conference
Fault models for embedded-DRAM macros
Proceedings of the 46th Annual Design Automation Conference
Self-repairing SRAM using on-chip detection and compensation
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
A new design-for-test technique for SRAM core-cell stability faults
Proceedings of the Conference on Design, Automation and Test in Europe
Detecting stability faults in sub-threshold SRAMs
Proceedings of the International Conference on Computer-Aided Design
Hi-index | 0.00 |