Test generation for delay faults in non-scan and partial scan sequential circuits
ICCAD '92 Proceedings of the 1992 IEEE/ACM international conference on Computer-aided design
A trace-based method for delay fault diagnosis in synchronous sequential circuits
EDTC '95 Proceedings of the 1995 European conference on Design and Test
DFSIM: A Gate-Delay Fault Simulator for Sequential Circuits
EDTC '96 Proceedings of the 1996 European conference on Design and Test
An optimized BIST test pattern generator for delay testing
VTS '97 Proceedings of the 15th IEEE VLSI Test Symposium
TranGen: a SAT-based ATPG for path-oriented transition faults
Proceedings of the 2004 Asia and South Pacific Design Automation Conference
Transition faults detection in bit parallel multipliers over GF(2m)
WSEAS Transactions on Circuits and Systems
Test generation in systolic architecture for multiplication over GF(2m)
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
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