Introduction to finite fields and their applications
Introduction to finite fields and their applications
C-testable design techniques for iterative logic arrays
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
A dual basis bit-serial systolic multiplier for GF(2m)
Integration, the VLSI Journal
Systolic Array Implementation of Euclid's Algorithm for Inversion and Division in GF (2m)
IEEE Transactions on Computers
IEEE Transactions on Computers
Transition Fault Simulation for Sequential Circuits
Proceedings of the IEEE International Test Conference on Discover the New World of Test and Design
EDTC '97 Proceedings of the 1997 European conference on Design and Test
High-Speed, Low-Complexity Systolic Designs of Novel Iterative Division Algorithms in GF(2^m)
IEEE Transactions on Computers
A digit-serial multiplier for finite field GF(2m)
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences
Transition Fault Testability in Bit Parallel Multipliers over GF(2^{m})
VTS '07 Proceedings of the 25th IEEE VLSI Test Symmposium
IEEE Design & Test
Transition path delay faults: a new path delay fault model for small and large delay defects
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Efficient semisystolic architectures for finite-field arithmetic
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Testing Transition Delay Faults in Modified Booth Multipliers
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
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This paper presents a test generation technique for detecting stuck-at (SAF) and transition delay fault (TDF) at gate level in the finite-field systolic multiplier over GF(2m) based on polynomial basis. The proposed technique derives test vectors from the cell expressions of systolic multipliers without any requirement of Automatic test Pattern Generation (ATPG) tool. The complete systolic architecture is C-testable for SAF and TDF with only six constant tests. The test vectors are independent of the multiplier size. The test set provides 100% single SAF and TDF coverage.