Test methodology for the McKinley processor

Debug Methodology for the McKinley Processor

ITC '01 Proceedings of the 2001 IEEE International Test Conference

Fault secureness need for next generation high performance microprocessor design for testability structures

Proceedings of the 1st conference on Computing frontiers

Won't On-Chip Clock Calibration Guarantee Performance Boost and Product Quality?

IEEE Transactions on Computers

Test set development for cache memory in modern microprocessors

IEEE Transactions on Very Large Scale Integration (VLSI) Systems

Sequential element design with built-in soft error resilience

IEEE Transactions on Very Large Scale Integration (VLSI) Systems