Improved technology mapping using a new approach to Boolean matching

  • Authors:
  • B. Kapoor

  • Affiliations:
  • Integrated Systems Laboratory, Texas Instruments, Inc., P. 0. Box 655474, MS 446, Dallas, TX

  • Venue:
  • EDTC '95 Proceedings of the 1995 European conference on Design and Test
  • Year:
  • 1995

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Abstract

We present an improved method for technology mapping using a new approach to the Boolean matching problem. Signatures computed over OBDDs using a set of specific probability values determine matches between library cells and portions of the netlist. Unlike some previous methods, which may require creation of up to O(n!) OBDDs for all possible permutations of module's inputs, our method requires exactly one OBDD to be created for the portion of the netlist being matched. Some results obtained on ISCAS85 benchmark circuits suggest the viability and validity of our approach.