Phantom redundancy: a high-level synthesis approach for manufacturability
ICCAD '95 Proceedings of the 1995 IEEE/ACM international conference on Computer-aided design
Algorithms for High-Level Synthesis
IEEE Design & Test
Automatic Synthesis of Self-Recovering VLSI Systems
IEEE Transactions on Computers
On-Line Fault Resilience Through Gracefully Degradable ASICs
Journal of Electronic Testing: Theory and Applications - Special issue on On-line testing
Self recovering controller and datapath codesign
DATE '99 Proceedings of the conference on Design, automation and test in Europe
Concurrent error recovery with near-zero latency in synthesized ASICs
Proceedings of the conference on Design, automation and test in Europe
On-line fault detection in a hardware/software co-design environment: system partitioning
Proceedings of the 14th international symposium on Systems synthesis
Reliability Properties Assessment at System Level: A Co-Design Framework
Journal of Electronic Testing: Theory and Applications
Design of concurrent test hardware for linear analog circuits with constrained hardware overhead
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Proceedings of the Conference on Design, Automation and Test in Europe
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We propose a novel graceful degradation scheme, L/U reconfiguration, which can tolerate a single permanent fault in each hardware class of ASIC data paths. In the proposed scheme, dynamic hardware rebinding and operation rescheduling are performed by a systematic perturbation of the original configuration. A high-level synthesis procedure, which automatically generates such fault-tolerant systems, is also presented. Experiments show that our reconfigurable AISC designs, as compared to optimal nonfault-tolerant designs, achieve optimal pre-reconfiguration and near-optimal post-reconfiguration speed performance.