Constructions of the SbEC-DbED and DbEC codes, and their applications

  • Authors:
  • G. L. Feng;Sihai Xiao;Xiaofa Shi;T. R. N. Rao

  • Affiliations:
  • -;-;-;-

  • Venue:
  • DFT '95 Proceedings of the IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems
  • Year:
  • 1995

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Abstract

Error control codes are now successfully applied to memory systems in order to enhance the system reliability. Among the error control codes, the distance-4 codes and the distance-5 codes are two of the most important classes of error control codes in the computer applications. For example, these two types of codes can be used to construct Error-Locating codes which have been applied to identify the faulty module for fault isolation and reconfiguration in fault-tolerant computer systems. The well known constructions for these two types of codes mere proposed by Chen [1986]. In this paper, we propose new construction schemes and decoding schemes for these two types of codes. The proposed constructions are able to improve the code lengths of Chen's codes, and the proposed decoding schemes are efficient.