Testing semiconductor memories: theory and practice
Testing semiconductor memories: theory and practice
Testing complex couplings in multiport memories
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Serial Interfacing for Embedded-Memory Testing
IEEE Design & Test
18.2 Fault Models and Tests for Two-Port Memories
VTS '98 Proceedings of the 16th IEEE VLSI Test Symposium
The concept of resistance interval: a new parametric model for realistic resistive bridging fault
VTS '95 Proceedings of the 13th IEEE VLSI Test Symposium
Journal of Electronic Testing: Theory and Applications - Special Issue on the 7th ASIAN TEST SYMPOSIUM, ATS-98
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