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Display of the earth taking into account atmospheric scattering
SIGGRAPH '93 Proceedings of the 20th annual conference on Computer graphics and interactive techniques
Ray Tracing Interference Color: Visualizing Newton's Rings
IEEE Computer Graphics and Applications
Wavelength dependent reflectance functions
SIGGRAPH '94 Proceedings of the 21st annual conference on Computer graphics and interactive techniques
Modeling and rendering of metallic patinas
SIGGRAPH '96 Proceedings of the 23rd annual conference on Computer graphics and interactive techniques
A Reflectance Model for Computer Graphics
ACM Transactions on Graphics (TOG)
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IEEE Transactions on Visualization and Computer Graphics
Ray Tracing Interference Color
IEEE Computer Graphics and Applications
3D graphics and the wave theory
SIGGRAPH '81 Proceedings of the 8th annual conference on Computer graphics and interactive techniques
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IEEE Computer Graphics and Applications
A simple layered RGB BRDF model
Graphical Models - Special issue on Pacific graphics 2002
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CGI'06 Proceedings of the 24th international conference on Advances in Computer Graphics
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This paper proposes a method for rendering objects coated with Multi-layer thin films. Multi-layer thin films are widely utilized in industry, for example, optical lenses, optical filters, and windowpanes, among others. Demand for visualization of the optical effects of multi-layer films has therefore become great.To visualize optical properties of such films, we have developed a method for calculating composite reflectance and transmittance of the system of multi-layer thin films, taking into consideration such factors as multiple reflection, interference and absorption of light inside the films.The proposed method is based on wave optics, and is able to accurately visualize the optical effects of multi-layer films consisting of not only dielectric materials, but also metallic and semi-conductive materials. Metallic and semi-conductive materials are able to absorb light, and their refractive indices are expressed as complex values. Dielectric materials, on the other hand, do not absorb light, and the refractive indices are expressed as real values. Taking into consideration complex refractive indices, the proposed method can visualize optical phenomena caused by various kinds of multi-layer thin films.The proposed method is implemented using a ray-tracer and optical properties of a SiO2 film coating on a silicon base, and several kinds of multi-layer films coating windowpanes or teapot are visualized to demonstrate the usefulness of the proposed method.