Design at high level of a robust 8-bit microprocessor to soft errors by using only standard gates
SBCCI '06 Proceedings of the 19th annual symposium on Integrated circuits and systems design
A New Approach to Single Event Effect Tolerance Based on Asynchronous Circuit Technique
Journal of Electronic Testing: Theory and Applications
Fault Tolerance Analysis of Communication System Interleavers: the 802.11a Case Study
Journal of Signal Processing Systems
Design of a soft-error robust microprocessor
Microelectronics Journal
Designing robust threshold gates against soft errors
Microelectronics Journal
Preserving Hamming Distance in Arithmetic and Logical Operations
Journal of Electronic Testing: Theory and Applications
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This paper presents a prototype of a hardened version of the 8051 micro-controller, able to assure reliable operation in the presence of bit flips caused by radiation. Aiming at avoiding such faults in the 8051 micro-controller, Hamming code protection was used in its SRAM memory and registers. This paper shows implementation details of this technique in the micro-controller VHDL description and the impact on the device area.