Cost reduction and evaluation of temporary faults detecting technique
DATE '00 Proceedings of the conference on Design, automation and test in Europe
Synthesis of an 8051-Like Micro-Controller Tolerant to Transient Faults
Journal of Electronic Testing: Theory and Applications
Modeling the Effect of Technology Trends on the Soft Error Rate of Combinational Logic
DSN '02 Proceedings of the 2002 International Conference on Dependable Systems and Networks
Designing fault tolerant systems into SRAM-based FPGAs
Proceedings of the 40th annual Design Automation Conference
Evaluation of a Soft Error Tolerance Technique Based on Time and/or Space Redundancy
SBCCI '00 Proceedings of the 13th symposium on Integrated circuits and systems design
Designing a Radiation Hardened 8051-Like Micro-Controller
SBCCI '00 Proceedings of the 13th symposium on Integrated circuits and systems design
Proceedings of the 15th symposium on Integrated circuits and systems design
Time Redundancy Based Soft-Error Tolerance to Rescue Nanometer Technologies
VTS '99 Proceedings of the 1999 17TH IEEE VLSI Test Symposium
On Implementing a Soft Error Hardening Technique by Using an Automatic Layout Generator: Case Study
IOLTS '05 Proceedings of the 11th IEEE International On-Line Testing Symposium
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The costs to protect a commercial microprocessor against soft errors are discussed in this work. Based on hardware and time redundancies, a protection scheme was designed at RT level to mitigate transient faults on combinational and memory circuits. A fault-tolerant IC version of a mass-produced 8-bit microprocessor is protected by the scheme. Design issues and results in area, performance and power are presented comparing the robust microprocessor with its non-protected version. The costs by flip-flop are also discussed permitting to estimate the overheads in area for any architecture. Furthermore, the RT-level protection scheme is compared with an electrical-level scheme based on a non-standard gate.