Embedded Deterministic Test for Low-Cost Manufacturing
IEEE Design & Test
Primitive Polynomials Over GF(2) of Degree up to 660 with Uniformly Distributed Coefficients
Journal of Electronic Testing: Theory and Applications
Planar High Performance Ring Generators
VTS '04 Proceedings of the 22nd IEEE VLSI Test Symposium
3-Stage Variable Length Continuous-Flow Scan Vector Decompression Scheme
VTS '04 Proceedings of the 22nd IEEE VLSI Test Symposium
Low-power fixed-width array multipliers
Proceedings of the 2004 international symposium on Low power electronics and design
High Performance Dense Ring Generators
IEEE Transactions on Computers
A scalable test structure for multicore chip
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
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Localized delay defects, like resistive shorts, resistiveopens, etc., can be effectively detected by testing the longesttestable path through each wire (or gate) in the circuit. Sucha delay test set is referred to as a longest-path-per-wire testset. ...