Timing-Driven Test Point Insertion for Full-Scan and Partial-Scan BIST
Proceedings of the IEEE International Test Conference on Driving Down the Cost of Test
Proceedings of the IEEE International Test Conference on Discover the New World of Test and Design
Calculatoin of Multiple Sets of Weights for Weighted-Random Testing
Proceedings of the IEEE International Test Conference on Designing, Testing, and Diagnostics - Join Them
Deterministic Pattern Generation for Weighted Random Pattern Testing
EDTC '96 Proceedings of the 1996 European conference on Design and Test
Test point insertion based on path tracing
VTS '96 Proceedings of the 14th IEEE VLSI Test Symposium
A New Weight Set Generation Algorithm for Weighted Random Pattern Generation
ICCD '99 Proceedings of the 1999 IEEE International Conference on Computer Design
Testability-Driven Random Test-Pattern Generation
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
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The number of weighted random patterns depends onthe sampling probability of the correspondingdeterministic test pattern. Therefore if the weight set isextracted from the deterministic pattern set with highsampling probabilities, the test length can be shortened.In this paper we present a new multiple weight setgeneration algorithm that generates high performanceweight sets by removing deterministic patterns with lowsampling probabilities. In addition, the weight set thatmakes the variance of sampling probabilities fordeterministic test patterns small, reduces the number ofthe deterministic test patterns with low samplingprobability. Henceforth we present a new weight setcalculation algorithm that uses the optimal candidatelist and reduces the variance of the sampling probability.The Results on ISCAS 85 and ISCAS 89 benchmarkcircuits prove the effectiveness of the new weight setcalculation algorithm.