Are Our Design for Testability Features Fault Secure?
Proceedings of the conference on Design, automation and test in Europe - Volume 1
Proceedings of the 1st conference on Computing frontiers
Won't On-Chip Clock Calibration Guarantee Performance Boost and Product Quality?
IEEE Transactions on Computers
Clock Faults Induced Min and Max Delay Violations
Journal of Electronic Testing: Theory and Applications
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The Alpha 21364 microprocessor consists of 153 million transistors operating at 1.2 GHz. The chip includes essentially all of the logic that previous generations relegated to hundreds of support ASICs, including a large L2 cache, memory controllers and a router. While this integration delivers outstanding performance and reliability, the consequent reduction of visibility in the base design posed significant challenges for debug. This paper describes architectural changes made in anticipation of these challenges, and their effect on the debug of this complex, leading edge design.