IEEE Spectrum
Design for soft-error robustness to rescue deep submicron scaling
ITC '98 Proceedings of the 1998 IEEE International Test Conference
On Totally Self-Checking Checkers for Separable Codes
IEEE Transactions on Computers
A Formal Approach to On-Line Monitoring of Digital VLSI Circuits: Theory, Design and Implementation
Journal of Electronic Testing: Theory and Applications
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In this paper, a new method for concurrent checking is proposed. For an arbitrarily given combinational circuit f an additional complementary circuit g is determined such that for every input the componentwise modulo 2 sum of the corresponding outputs of f and g is an element of a considered code as long as no error occurs. The new method of concurrent checking is developed for the concrete case of 1-out-of-4 codes.