An Interval-Based Diagnosis Scheme for Identifying Failing Vectors in a Scan-BIST Environment

Authors:
C. Liu;K. Chakrabarty;M. Goessel
Affiliations:
-;Dept. Electrical & Computer Engineering, Duke University, Durham, NC;Institute of Computer Science, University of Potsdam, 14469 Potsdam, Germany
Venue:
Proceedings of the conference on Design, automation and test in Europe
Year:
2002

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Abstract

We present a new scan-BIST approach for determiningfailing vectors for fault diagnosis. This approach is based onthe application of overlapping intervals of test vectors to thecircuit under test. Two MISRs are used in an interleavedfashion to generate intermediate signatures, thereby obviatingthe need for multiple test sessions. The knowledge of failingand non-falling intervals is used to obtain a set S of candidatefailing vectors that includes all the actual (true) failing vectors.We present analytical results to determine an appropriateinterval length and the degree of overlap, an upper bound onthe size of S, and a lower bound on the number of true failingvectors; the latter depends only on the knowledge of failingand non-failing intervals. Finally, we describe two pruningprocedures that allow us to reduce the size of S, whileretaining most true failing vectors in S. We presentexperimental results for the ISCAS 89 benchmark circuits todemonstrate the effectiveness of the proposed scan-BISTdiagnosis approach.