Built-In Dynamic Current Sensor for Hard-to-Detect Faults in Mixed-Signal Ics

Authors:
Y. Lechuga;R. Mozuelos;M. Martínez;S. Bracho
Affiliations:
Microelectronics Engineering Group, Electronic Technology Automatic and System Engineering Department, University of Cantabria, Avda. de los Castros s/n. E-39005 Santander (Spain);Microelectronics Engineering Group, Electronic Technology Automatic and System Engineering Department, University of Cantabria, Avda. de los Castros s/n. E-39005 Santander (Spain);Microelectronics Engineering Group, Electronic Technology Automatic and System Engineering Department, University of Cantabria, Avda. de los Castros s/n. E-39005 Santander (Spain);Microelectronics Engineering Group, Electronic Technology Automatic and System Engineering Department, University of Cantabria, Avda. de los Castros s/n. E-39005 Santander (Spain)
Venue:
Proceedings of the conference on Design, automation and test in Europe
Year:
2002

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Abstract

There are some types of faults in analogue and mixedsignal circuits which are very difficult to detect usingeither voltage or current based test methods. However, itis possible to detect these faults if we add to theconventional dynamic power supply current test methodsIDDT, the analysis of the changes in the slope of thisdynamic power supply current. In this work, we present aBuilt-In Current Sensor (BICS) which is able to processthe highest frequency components in the dynamic powersupply current of the circuit under test (CUT). The BICSadd to the resistive sensor an inductance made from agyrator and a capacitor to carry out the current to voltageconversion. Moreover, the proposed test method improvesthe fault coverage in continuous circuits and switchedcurrent circuits as well.